Susan E. Babcock

Professor

Room: 215
Materials Science and Engineering
1509 University Avenue
Madison, WI 53706

Ph: (608) 263-5696
Fax: (608) 262-8353
babcock@engr.wisc.edu

Primary Affiliation:
Materials Science and Engineering

Additional Affiliations:
Materials Science Program,


Profile Summary

The core structure of grain boundaries and other solid-solid interfaces any associated composition change generally are localized to a few atomic plane spacings perpendicular to the boundary. Understanding of the structure and effectiveness of compliant and other engineered substrates demands detailed characterization of the defect type and distribution in the substrate and growth layers. As a result, our research group uses very high spatial resolution techniques for composition and structure determinations with a focus on techniques of high resolution imaging and analystical transmission and scanning transmission electron microscopy. The theme of my research is structure-property relationships for solid-solid interfaces. We focus our work on interfaces and defect structures in engineered substrates for growth of large-lattice mismatched compound semiconductors like GaN. Our work on complaint and other engineered substrates for GaN growth focuses on detailed characterization of defect microstructure in the film and substrate with the goal of understanding the mechanisms by which the substrate leads to improved film quality.

Education

  • SB (Materials Science and Engineering) 1982, Massachusetts Institute of Technology
  • PhD (Materials Science) 1987, Massachusetts Institute of Technology

Research Interests

  • applications of electron microscopy in materials research
  • solid-solid interfaces
  • crystal defect microstructures
  • microstructure in films and engineered substrates of/for compound semiconductors

Awards, Honors and Societies

  • Member, Steering Committee, Argonne Electron Microscopy Center.
  • Editorial Board, J. Interface Science.
  • Member of MRS, (Electron) Microscopy Society of America, American Society for the Advancement of Science.

Courses

Fall 2014-2015

  • MS&E 351 - Materials Science-Structure and Property Relations in Solids
  • MS&E 990 - Research and Thesis
  • MS&E 890 - Pre-Dissertator\'s Research
  • MS&E 803 - Special Topics in Materials Science
  • MS&E 790 - Master\'s Research or Thesis
  • Profile Summary

    The core structure of grain boundaries and other solid-solid interfaces any associated composition change generally are localized to a few atomic plane spacings perpendicular to the boundary. Understanding of the structure and effectiveness of compliant and other engineered substrates demands detailed characterization of the defect type and distribution in the substrate and growth layers. As a result, our research group uses very high spatial resolution techniques for composition and structure determinations with a focus on techniques of high resolution imaging and analystical transmission and scanning transmission electron microscopy. The theme of my research is structure-property relationships for solid-solid interfaces. We focus our work on interfaces and defect structures in engineered substrates for growth of large-lattice mismatched compound semiconductors like GaN. Our work on complaint and other engineered substrates for GaN growth focuses on detailed characterization of defect microstructure in the film and substrate with the goal of understanding the mechanisms by which the substrate leads to improved film quality.


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